1 edition of Search and retrieval index to EOS/ESD Symposium proceedings, 1979 to 1988. found in the catalog.
Search and retrieval index to EOS/ESD Symposium proceedings, 1979 to 1988.
by 1989 EOS/ESD Symposium in Rome, NY (Norstar Bldg., 200 Liberty Plaza, Rome 13440)
Written in English
|Other titles||EOS/ESD Symposium proceedings index, 1979 to 1988.|
|Contributions||IIT Research Institute., EOS/ESD Association., Electrical Overstress/Electrostatic Discharge Symposium.|
|LC Classifications||TK7869 .S43 1989|
|The Physical Object|
|Pagination||vi, 102 p. ;|
|Number of Pages||102|
|LC Control Number||89083417|
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This book contains indexes used in searching for information contained in papers produced in Electrical Overstress/Electrostatic Discharge (EOS/ESD) Symposium to These indexes are the Alphabetical List of Index Terms, Subject Index, Author Index, Corporate Index, Keywords in Title Index, and Chronological List of Papers Index.
These indexes provide a clear, easy-to-read, and Author: R E Rash, R T Wanner. Event,” EOS/ESD Symposium Proceedings,ESD Association, Rome, NY.
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Richier et al. Investigation on different ESD protection strategies devoted to V RF applications (2 GHz) in a mm CMOS process. Proceedings of the EOS/ESD Symposium, ; – The book draws from a large publication base in this area, the bulk of which is available through the Proceedings of the EOS/ESD Symposium, which is held annually and deals with all areas of ESD.
Much of the detailed understanding of ESD in ICs has been presented at this symposium. An EOS/ESD event due to improper handling was suspected since pin #5 on the microprocessor is the only pin that is connected directly to an output pin on the circuit card. During routine maintenance of the radar set, this circuit card is removed and replaced frequently.
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